锂(li)电池保护板不良分析及技术参(can)数(shu)、主要零件(jian)功能(neng)基础知识分享-KIA MOS管
信息(xi)来源:本站(zhan) 日期:2019-07-09
锂电(dian)(dian)(dian)池保(bao)护(hu)(hu)板是对串(chuan)联锂电(dian)(dian)(dian)池组的(de)(de)充(chong)放(fang)电(dian)(dian)(dian)保(bao)护(hu)(hu);在(zai)充(chong)满电(dian)(dian)(dian)时(shi)(shi)能(neng)保(bao)证各(ge)单(dan)体(ti)(ti)电(dian)(dian)(dian)池之间的(de)(de)电(dian)(dian)(dian)压差异小于设定值(一(yi)般±20mV),实现电(dian)(dian)(dian)池组各(ge)单(dan)体(ti)(ti)电(dian)(dian)(dian)池的(de)(de)均(jun)充(chong),有效地(di)改善了串(chuan)联充(chong)电(dian)(dian)(dian)方(fang)式下的(de)(de)充(chong)电(dian)(dian)(dian)效果;同时(shi)(shi)检测(ce)电(dian)(dian)(dian)池组中各(ge)个(ge)单(dan)体(ti)(ti)电(dian)(dian)(dian)池的(de)(de)过压、欠(qian)压、过流、短路、过温状态(tai),保(bao)护(hu)(hu)并延长电(dian)(dian)(dian)池使(shi)用(yong)寿命;欠(qian)压保(bao)护(hu)(hu)使(shi)每(mei)一(yi)单(dan)节电(dian)(dian)(dian)池在(zai)放(fang)电(dian)(dian)(dian)使(shi)用(yong)时(shi)(shi)避免电(dian)(dian)(dian)池因过放(fang)电(dian)(dian)(dian)而损坏。
锂(li)(li)(li)电(dian)池(chi)(chi)(chi)芯(xin)和保(bao)(bao)护(hu)板(ban)(ban),锂(li)(li)(li)电(dian)池(chi)(chi)(chi)芯(xin)主要由正极板(ban)(ban)、隔膜、负极板(ban)(ban)、电(dian)解(jie)(jie)液组成;正极板(ban)(ban)、隔膜、负极板(ban)(ban)缠绕或层叠,包装,灌注电(dian)解(jie)(jie)液,封装后即(ji)制成电(dian)芯(xin),锂(li)(li)(li)电(dian)池(chi)(chi)(chi)保(bao)(bao)护(hu)板(ban)(ban)的(de)作用(yong)很多(duo)人都不知(zhi)道,锂(li)(li)(li)电(dian)池(chi)(chi)(chi)保(bao)(bao)护(hu)板(ban)(ban),顾名思义就是(shi)(shi)保(bao)(bao)护(hu)锂(li)(li)(li)电(dian)池(chi)(chi)(chi)用(yong)的(de),锂(li)(li)(li)电(dian)池(chi)(chi)(chi)保(bao)(bao)护(hu)板(ban)(ban)的(de)作用(yong)是(shi)(shi)保(bao)(bao)护(hu)电(dian)池(chi)(chi)(chi)不过(guo)放、不过(guo)充、不过(guo)流,还有就是(shi)(shi)输出(chu)短路保(bao)(bao)护(hu)。
均衡电流(liu) :80mA(VCELL=4.20V时)
均衡起控(kong)点:4.18±0.03 V
过充门限(xian) :4.25±0.05 V (4.30±0.05 V可选(xuan))
过放门(men)限 :2.90±0.08 V (2.40±0.05 V可(ke)选(xuan))
过放延(yan)时 :5mS
过(guo)放(fang)释放(fang) :断开负载,并(bing)且各单(dan)体电(dian)池电(dian)压均高于过(guo)放(fang)门限;
过(guo)流释放 :断开负载(zai)释放
过温保护(hu) :有接口,需安装(zhuang)可恢复性温度保护(hu)开关;
工作电流 :15A(根(gen)据客户选择)
静态(tai)功(gong)耗 :<0.5mA
短路保护(hu)功(gong)能:能保护(hu),断开(kai)负载可自恢复。
主要功(gong)(gong)能:过(guo)充(chong)保(bao)护(hu)功(gong)(gong)能,过(guo)放(fang)保(bao)护(hu)功(gong)(gong)能,短路保(bao)护(hu)功(gong)(gong)能,过(guo)流保(bao)护(hu)功(gong)(gong)能,过(guo)温保(bao)护(hu)功(gong)(gong)能,均衡保(bao)护(hu)功(gong)(gong)能。
接(jie)口(kou)(kou)定义(yi):该板的(de)充电口(kou)(kou)与放电口(kou)(kou)相互独立,两(liang)者共正极,B-为连(lian)接(jie)电池的(de)负极,C-为充电口(kou)(kou)的(de)负极;P-为放电口(kou)(kou)的(de)负极;B-、P-、C-焊盘(pan)(pan)均(jun)是过(guo)孔式(shi),焊盘(pan)(pan)孔直(zhi)径均(jun)为3mm;电池各充电检测接(jie)口(kou)(kou)以DC针座形式(shi)输出。
参数说明:最大(da)工(gong)作电流和(he)过(guo)流保(bao)护电流值的(de)配置,单位(wei):A(5/8,8/15,10/20,12/25,15/30,20/40,25/35,30/50,35/60,50/80,80/100),特殊过(guo)流值可以按客户要求(qiu)定制。
控制(zhi)(zhi)ic,2、开关管(guan),另外还加一些微容和微阻而组成(cheng)。控制(zhi)(zhi)ic 作用(yong)是对电(dian)池(chi)的(de)保护(hu),如(ru)达(da)到保护(hu)条件就(jiu)控制(zhi)(zhi)mos进行(xing)断开或闭合(如(ru)电(dian)池(chi)达(da)到过充、过放、短路、过流、等保护(hu)条件),其中mos管(guan)的(de)作用(yong)就(jiu)是开关作用(yong),由控制(zhi)(zhi)ic开控制(zhi)(zhi)。
锂(li)(li)(li)电(dian)池(可充型)之所以(yi)需要保(bao)(bao)护(hu),是由(you)它本身(shen)特(te)性(xing)决定的(de)。由(you)于锂(li)(li)(li)电(dian)池本身(shen)的(de)材料(liao)决定了它不能(neng)被过(guo)(guo)(guo)充、过(guo)(guo)(guo)放(fang)、过(guo)(guo)(guo)流(liu)、短路(lu)及超(chao)高温充放(fang)电(dian),因此锂(li)(li)(li)电(dian)池锂(li)(li)(li)电(dian)组件总会跟着(zhe)一(yi)块精致的(de)保(bao)(bao)护(hu)板(ban)和(he)一(yi)片电(dian)流(liu)保(bao)(bao)险器出现。锂(li)(li)(li)电(dian)池的(de)保(bao)(bao)护(hu)功能(neng)通常由(you)保(bao)(bao)护(hu)电(dian)路(lu)板(ban)和(he)PTC协(xie)同完成,保(bao)(bao)护(hu)板(ban)是由(you)电(dian)子电(dian)路(lu)组成,在-40℃至+85℃的(de)环境(jing)下(xia)时刻准确的(de)监视(shi)电(dian)芯(xin)的(de)电(dian)压和(he)充放(fang)回路(lu)的(de)电(dian)流(liu)。
1、过充(chong)保护及(ji)过充(chong)保护恢复
当(dang)电(dian)(dian)(dian)(dian)池(chi)被(bei)充(chong)电(dian)(dian)(dian)(dian)使电(dian)(dian)(dian)(dian)压(ya)(ya)(ya)超过设定值VC(4.25-4.35V,具(ju)体(ti)过充(chong)保护电(dian)(dian)(dian)(dian)压(ya)(ya)(ya)取决(jue)于IC)后,VD1翻转使Cout变为(wei)低电(dian)(dian)(dian)(dian)平(ping),T1截止(zhi),充(chong)电(dian)(dian)(dian)(dian)停止(zhi).当(dang)电(dian)(dian)(dian)(dian)池(chi)电(dian)(dian)(dian)(dian)压(ya)(ya)(ya)回落至VCR(3.8-4.1V,具(ju)体(ti)过充(chong)保护恢复电(dian)(dian)(dian)(dian)压(ya)(ya)(ya)取决(jue)于IC)时(shi),Cout变为(wei)高电(dian)(dian)(dian)(dian)平(ping),T1导(dao)通(tong)充(chong)电(dian)(dian)(dian)(dian)继(ji)续, VCR必(bi)须小于VC一个定值,以防止(zhi)频繁跳变。
2、过放保护(hu)及(ji)过放保护(hu)恢复
当电(dian)(dian)池(chi)电(dian)(dian)压因放电(dian)(dian)而降(jiang)低至设定值VD(2.3-2.5V,具体(ti)过充(chong)保(bao)护电(dian)(dian)压取(qu)决于IC)时, VD2翻转,以短时间延时后,使Dout变为低电(dian)(dian)平,T2截止,放电(dian)(dian)停止,当电(dian)(dian)池(chi)被置于充(chong)电(dian)(dian)时,内部(bu)或门被翻转而使T2再(zai)次导(dao)通为下次放电(dian)(dian)作(zuo)好准备。
3、过流、短路(lu)保护
当电(dian)路充(chong)放(fang)回路电(dian)流超过设(she)定值(zhi)或被短路时,短路检测电(dian)路动作,使MOS管关断,电(dian)流截止。
R1:基准(zhun)供电(dian)(dian)电(dian)(dian)阻;与(yu)IC内部(bu)电(dian)(dian)阻构成分压(ya)电(dian)(dian)路,控(kong)制内部(bu)过(guo)充(chong)、过(guo)放电(dian)(dian)压(ya)比较器的电(dian)(dian)平翻转;一般(ban)在阻值为330Ω、470Ω比较多(duo);当封(feng)装形(xing)式(即(ji)用标准(zhun)元件的长和宽(kuan)来表示(shi)(shi)元件大小,如0402封(feng)装标识此元件的长和宽(kuan)分别(bie)为1.0mm和0.5mm)较大时(shi),会用数字标识其阻值,如贴片(pian)电(dian)(dian)阻上数字标识473, 即(ji)表示(shi)(shi)其阻值为47000Ω即(ji)47KΩ(第(di)三位(wei)数表示(shi)(shi)在前两位(wei)后面加(jia)0的位(wei)数)。
R2:过流(liu)、短(duan)(duan)路检(jian)测(ce)电阻(zu);通过检(jian)测(ce)VM端(duan)电压控制(zhi)保护(hu)板的电流(liu) ,焊(han)接不(bu)良、损坏会(hui)造成电池过流(liu) 、短(duan)(duan)路无保护(hu),一(yi)般阻(zu)值(zhi)为1KΩ、2KΩ较多。
R3:ID识别电阻(zu)或(huo)NTC电阻(zu)(前面有介(jie)绍(shao))或(huo)两者都有。
总结:电(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)在保(bao)护板中(zhong)为黑色(se)贴(tie)片,用万用表可测(ce)其(qi)阻(zu)(zu)(zu)值,当封装(zhuang)较大时其(qi)阻(zu)(zu)(zu)值会用数(shu)字(zi)表示,表示方法如上所(suo)述,当然电(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)阻(zu)(zu)(zu)值一(yi)般(ban)都有偏差(cha),每个电(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)都有精(jing)度规(gui)格(ge),如10KΩ电(dian)(dian)(dian)(dian)阻(zu)(zu)(zu)规(gui)格(ge)为+/-5%精(jing)度则其(qi)阻(zu)(zu)(zu)值为9.5KΩ -10.5KΩ范(fan)围内都为合格(ge)。
C1、C2:由于电(dian)(dian)(dian)容两端电(dian)(dian)(dian)压不能突变,起瞬间稳压和(he)滤波作用。总结(jie):电(dian)(dian)(dian)容在保护板中为黄(huang)色贴片(pian),封装形式0402较多,也有(you)少数(shu)0603封装(1.6mm长,0.8mm宽);用万用表(biao)检测其阻值一般(ban)为无穷(qiong)大或MΩ级(ji)别;电(dian)(dian)(dian)容漏(lou)电(dian)(dian)(dian)会产(chan)生(sheng)自耗电(dian)(dian)(dian)大,短路无自恢(hui)复现象。FUSE:普通FUSE或PTC(Positive Temperature Coefficient的缩写,意思(si)是正(zheng)温度系数(shu));防止不安全大电(dian)(dian)(dian)流和(he)高(gao)温放(fang)电(dian)(dian)(dian)的发生(sheng),其中PTC有(you)自恢(hui)复功能。
总结:FUSE在保护板(ban)中一般为白色(se)贴片,LITTE公司提供FUSE会在FUSE上(shang)标识字符D-T,字符表示意思为FUSE能承(cheng)受的额(e)定(ding)电流,如表示D额(e)定(ding)电流为0.25A,S为4A,T为5A等。
U1:控(kong)制IC;保护板所(suo)有功能都是IC通过(guo)监视(shi)连接在VDD-VSS间的电(dian)压差(cha)及VM-VSS间的电(dian)压差(cha)而控(kong)制C-MOS执行开关动作来实现的。
Cout:过充(chong)控(kong)制(zhi)端;通(tong)过MOS管T2栅极电压控(kong)制(zhi)MOS管的开关。
Dout:过(guo)放、过(guo)流、短路控制端;通(tong)过(guo)MOS管T1栅(zha)极电压控制MOS管的开关。
VM:过(guo)流(liu)、短路保护(hu)电压检测端;通过(guo)检测VM端的(de)电压实(shi)现电路的(de)过(guo)流(liu)、短路保护(hu)
(U(VM)=I*R(MOSFET))
总结(jie):IC在保护板中一般为6个管(guan)(guan)脚(jiao)的封(feng)装(zhuang)(zhuang)形(xing)式,其区别(bie)(bie)管(guan)(guan)脚(jiao)的方(fang)法(fa)为:在封(feng)装(zhuang)(zhuang)体上(shang)标(biao)识(shi)(shi)黑(hei)点(dian)的附近为第(di)1管(guan)(guan)脚(jiao),然后(hou)逆时针旋(xuan)转分别(bie)(bie)为第(di)2、3、4、5、6管(guan)(guan)脚(jiao);如封(feng)装(zhuang)(zhuang)体上(shang)无黑(hei)点(dian)标(biao)识(shi)(shi),则正看封(feng)装(zhuang)(zhuang)体上(shang)字符左下为第(di)1管(guan)(guan)脚(jiao),其余管(guan)(guan)脚(jiao)逆时针类(lei)推)C-MOS:场(chang)效应开
关管;保护功能的(de)实(shi)现(xian)者(zhe) ;连焊、虚焊、假(jia)焊、击穿时会造成(cheng)电池无保护、无显示、输出电压低等(deng)不良现(xian)象。
总结:CMOS在(zai)保(bao)护板(ban)中一般为8个(ge)管脚的封(feng)装形式,它时由(you)两(liang)个(ge)MOS管构(gou)成,相当于两(liang)个(ge)开关,分别(bie)控制过充(chong)保(bao)护和过放、过流、短路保(bao)护;其(qi)管脚区分方(fang)法和IC一样。
在(zai)保护板正常(chang)情况下,Vdd为(wei)高(gao)电(dian)平(ping),Vss、VM为(wei)低电(dian)平(ping),Dout、Cout为(wei)高(gao)电(dian)平(ping);当Vdd、Vss、VM任(ren)何一项参数变换(huan)时(shi),Dout或Cout的电(dian)平(ping)将发生变化,此时(shi)MOSFET执行相应(ying)的动作(开(kai)、关(guan)电(dian)路(lu)),从而实现电(dian)路(lu)的保护和(he)恢复(fu)功(gong)能。
此类不良首先排除电(dian)(dian)芯(xin)不良(电(dian)(dian)芯(xin)本来无电(dian)(dian)压(ya)(ya)或电(dian)(dian)压(ya)(ya)低),如果(guo)电(dian)(dian)芯(xin)不良则应测试保护板的自(zi)耗电(dian)(dian),看是(shi)否是(shi)保护板自(zi)耗电(dian)(dian)过大导致电(dian)(dian)芯(xin)电(dian)(dian)压(ya)(ya)低。如果(guo)电(dian)(dian)芯(xin)电(dian)(dian)压(ya)(ya)正常(chang),则是(shi)由(you)于保护板整个回路(lu)不通(元(yuan)器件虚焊、假焊、FUSE不良、PCB板内部电(dian)(dian)路(lu)不通、过孔不通、MOS、IC损坏(huai)等)。具体(ti)分析步(bu)骤如下:
(一)用(yong)万用(yong)表(biao)(biao)黑表(biao)(biao)笔接(jie)电芯负极,红(hong)表(biao)(biao)笔依次接(jie)FUSE、R1电阻两端,IC的Vdd、Dout、Cout端,P+端(假设(she)电芯电压为(wei)(wei)3.8V),逐段进行分(fen)析,此几个测试点都应(ying)为(wei)(wei)3.8V。若不(bu)是(shi),则此段电路(lu)有问题。
1. FUSE两端电压有变(bian)化(hua):测试FUSE是否导(dao)通(tong),若(ruo)导(dao)通(tong)则是PCB板内部电路不通(tong);若(ruo)不导(dao)通(tong)则FUSE有问题(来料(liao)不良、过流损坏(MOS或IC控制失效)、材质有问题(在MOS或IC动作之前FUSE被烧坏),然后用导(dao)线短接FUSE,继续往(wang)后分析。
2. R1电(dian)阻(zu)(zu)(zu)两端电(dian)压有变化:测(ce)试R1电(dian)阻(zu)(zu)(zu)值,若电(dian)阻(zu)(zu)(zu)值异常,则可(ke)能是(shi)虚焊,电(dian)阻(zu)(zu)(zu)本(ben)身(shen)断裂。若电(dian)阻(zu)(zu)(zu)值无异常,则可(ke)能是(shi)IC内部电(dian)阻(zu)(zu)(zu)出现问题。
3. IC测试端电压有变化:Vdd端与R1电阻相连。Dout、Cout端异常,则是由(you)于IC虚焊或损坏。
4. 若前面电压(ya)都无变化,测(ce)试B-到P+间的(de)电压(ya)异常,则是由于保护板(ban)正极过孔不(bu)通(tong)。
(二)万用(yong)表(biao)红表(biao)笔(bi)接电芯正极,激活MOS管后(hou),黑表(biao)笔(bi)依(yi)次接MOS管2、3脚,6、7脚,P-端。
1.MOS管2、3脚(jiao),6、7脚(jiao)电压(ya)有变化,则表示MOS管异(yi)常。
2.若MOS管(guan)电压无(wu)变(bian)化,P-端电压异常,则(ze)是(shi)由(you)于保(bao)护板负(fu)极过孔不通(tong)。
1. VM端电(dian)阻出现问题:可(ke)用万用表(biao)一表(biao)笔接IC2脚,一表(biao)笔接与VM端电(dian)阻相连的MOS管(guan)管(guan)脚,确(que)认其电(dian)阻值大(da)小(xiao)。看电(dian)阻与IC、MOS管(guan)脚有无(wu)虚焊。
2. IC、MOS异常:由(you)于过放保护(hu)(hu)与过流、短(duan)路保护(hu)(hu)共用一个MOS管(guan),若短(duan)路异常是(shi)由(you)于MOS出现(xian)问题,则此板应无过放保护(hu)(hu)功(gong)能(neng)。
3. 以上为正常状况下(xia)的(de)不良,也可能(neng)出(chu)现IC与MOS配置不良引(yin)起(qi)的(de)短路异常。如(ru)前期出(chu)现的(de)BK-901,其(qi)(qi)型(xing)号为‘312D’的(de)IC内延迟(chi)时间(jian)过(guo)长,导致在IC作出(chu)相应(ying)动作控制(zhi)之前MOS或其(qi)(qi)它元(yuan)器件(jian)已被损坏。注:其(qi)(qi)中确定IC或MOS是(shi)否(fou)发生异常最简易、直接(jie)的(de)方法就是(shi)对有怀疑的(de)元(yuan)器件(jian)进行(xing)更换(huan)。
1. 设计时所用IC本来没有自恢复(fu)功能,如G2J,G2Z等。
2. 仪器设置短路恢(hui)复时(shi)间(jian)过短,或短路测试(shi)时(shi)未将(jiang)负载(zai)移开(kai),如(ru)用(yong)(yong)万(wan)用(yong)(yong)表(biao)电(dian)压档进行短路表(biao)笔短接后未将(jiang)表(biao)笔从测试(shi)端移开(kai)(万(wan)用(yong)(yong)表(biao)相当于(yu)一个几兆的负载(zai))。
3. P+、P-间漏电(dian),如焊盘之(zhi)间存在带杂(za)质的(de)松香,带杂(za)质的(de)黄(huang)胶(jiao)或P+、P-间电(dian)容被击穿,IC Vdd到Vss间被击穿.(阻(zu)值只有几K到几百K)。
4. 如果以上都没问题,可能IC被击穿,可测(ce)试(shi)IC各管脚之间阻值。
1. 由于(yu)MOS内(nei)(nei)阻(zu)相对比(bi)较(jiao)稳定,出(chu)现内(nei)(nei)阻(zu)大(da)情况,首先怀疑的应该是FUSE或PTC这些内(nei)(nei)阻(zu)相对比(bi)较(jiao)容易发生变化的元器件。
2. 如果FUSE或PTC阻(zu)(zu)值(zhi)正常,则视保护板结构检测P+、P-焊盘与元器件面之间的过(guo)孔(kong)阻(zu)(zu)值(zhi),可能(neng)过(guo)孔(kong)出(chu)现(xian)微(wei)断现(xian)象,阻(zu)(zu)值(zhi)较大(da)。
3. 如果(guo)以上(shang)多没(mei)有(you)(you)问(wen)题,就要怀疑(yi)MOS是(shi)否(fou)出现异(yi)常:首先确定焊接(jie)有(you)(you)没(mei)有(you)(you)问(wen)题;其次看板的(de)厚度(是(shi)否(fou)容易弯折),因为(wei)弯折时可能(neng)导致(zhi)管(guan)脚焊接(jie)处异(yi)常;再将(jiang)MOS管(guan)放到显微镜下观测是(shi)否(fou)破(po)裂;最后用万用表测试MOS管(guan)脚阻值,看是(shi)否(fou)被击穿。
1. ID电阻(zu)(zu)(zu)本身由于虚焊、断裂或(huo)因电阻(zu)(zu)(zu)材质不过关而出现异常:可重(zhong)新焊接电阻(zu)(zu)(zu)两端(duan),若重(zhong)焊后ID正常则(ze)是(shi)电阻(zu)(zu)(zu)虚焊,若断裂则(ze)电阻(zu)(zu)(zu)会在重(zhong)焊后从中裂开。
2. ID过(guo)孔不导通:可(ke)用万用表测试(shi)过(guo)孔两(liang)端(duan)。
3. 内部线路出现(xian)问题:可刮开(kai)阻焊漆看内部电(dian)路有(you)无(wu)断开(kai)、短路现(xian)象(xiang)。
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