功率MOS管(guan)驱动(dong)电(dian)路图文分析与功率MOS管(guan)保护电(dian)路设(she)计解析-KIA MOS管(guan)
信息来源(yuan):本站 日期:2019-04-26
功率MOS场(chang)(chang)效(xiao)(xiao)应晶体管(guan),即MOSFET,其原意是:MOS(Metal Oxide Semiconductor金属(shu)氧化物(wu)半(ban)导体),FET(Field Effect Transistor场(chang)(chang)效(xiao)(xiao)应晶体管(guan)),即以(yi)金属(shu)层(ceng)(M)的(de)(de)栅极隔着氧化层(ceng)(O)利(li)用电场(chang)(chang)的(de)(de)效(xiao)(xiao)应来控制半(ban)导体(S)的(de)(de)场(chang)(chang)效(xiao)(xiao)应晶体管(guan)。
N沟道增强(qiang)型小功率(lv)MOS管的结构示意图
功率mos的工作原(yuan)理为:截止:漏源极间(jian)(jian)(jian)加正电源,栅源极间(jian)(jian)(jian)电压为零(ling)。P基区(qu)与N漂(piao)移区(qu)之间(jian)(jian)(jian)形成的PN结J1反偏,漏源极之间(jian)(jian)(jian)无电流(liu)流(liu)过。
导电(dian)(dian):在(zai)栅(zha)(zha)源极(ji)(ji)(ji)间加正电(dian)(dian)压(ya)UGS,栅(zha)(zha)极(ji)(ji)(ji)是(shi)绝缘的(de)(de),所以(yi)不会有栅(zha)(zha)极(ji)(ji)(ji)电(dian)(dian)流流过。但栅(zha)(zha)极(ji)(ji)(ji)的(de)(de)正电(dian)(dian)压(ya)会将其下面P区(qu)中(zhong)的(de)(de)空(kong)穴推开,而将P区(qu)中(zhong)的(de)(de)少子—电(dian)(dian)子吸引到(dao)栅(zha)(zha)极(ji)(ji)(ji)下面的(de)(de)P区(qu)表面。当UGS大于(yu)UT(开启(qi)电(dian)(dian)压(ya)或阈值电(dian)(dian)压(ya))时,栅(zha)(zha)极(ji)(ji)(ji)下P区(qu)表面的(de)(de)电(dian)(dian)子浓(nong)度(du)将超过空(kong)穴浓(nong)度(du),使P型(xing)半导体(ti)反(fan)(fan)型(xing)成N型(xing)而成为反(fan)(fan)型(xing)层(ceng),该反(fan)(fan)型(xing)层(ceng)形成N沟道(dao)而使PN结(jie)J1消失,漏极(ji)(ji)(ji)和源极(ji)(ji)(ji)导电(dian)(dian)。
功(gong)(gong)率MOS管自身拥(yong)有众(zhong)多优点,但是(shi)MOS管具有较脆弱(ruo)的(de)承受(shou)短(duan)时过(guo)载能力,特别是(shi)在(zai)高频的(de)应(ying)用场合,所以在(zai)应(ying)用功(gong)(gong)率MOS管对必须(xu)为(wei)其设计(ji)合理(li)的(de)保(bao)护电路(lu)来提高器件的(de)可(ke)靠性,MOS管作(zuo)用是(shi)什么
功率MOS管保护电路主要(yao)有以下(xia)几(ji)个方面:
1)防止栅极 di/dt过(guo)高:由于采用驱动芯片(pian),其输出(chu)阻抗较低,直接驱动功率(lv)管(guan)会(hui)引起驱动的(de)(de)功率(lv)管(guan)快速(su)的(de)(de)开通(tong)和关(guan)断,有可(ke)能(neng)造成功率(lv)管(guan)漏源极间的(de)(de)电(dian)(dian)压震(zhen)荡,或者有可(ke)能(neng)造成功率(lv)管(guan)遭受过(guo)高的(de)(de)di/dt而引起误导通(tong)。为避免上述(shu)现(xian)象(xiang)的(de)(de)发生,通(tong)常在MOS驱动器的(de)(de)输出(chu)与MOS管(guan)的(de)(de)栅极之间串联一个电(dian)(dian)阻,电(dian)(dian)阻的(de)(de)大小一般选取(qu)几十欧姆。
2)防(fang)止(zhi)栅(zha)(zha)(zha)源极(ji)(ji)(ji)(ji)间(jian)过(guo)电(dian)压(ya) 由于栅(zha)(zha)(zha)极(ji)(ji)(ji)(ji)与(yu)源极(ji)(ji)(ji)(ji)的(de)阻抗很高,漏极(ji)(ji)(ji)(ji)与(yu)源极(ji)(ji)(ji)(ji)间(jian)的(de)电(dian)压(ya)突变会通过(guo)极(ji)(ji)(ji)(ji)间(jian)电(dian)容(rong)耦合到栅(zha)(zha)(zha)极(ji)(ji)(ji)(ji)而产生相当高的(de)栅(zha)(zha)(zha)源尖(jian)峰(feng)电(dian)压(ya),此电(dian)压(ya)会使(shi)很薄(bo)的(de)栅(zha)(zha)(zha)源氧(yang)化层(ceng)击穿,同时(shi)栅(zha)(zha)(zha)极(ji)(ji)(ji)(ji)很容(rong)易(yi)积累电(dian)荷(he)也会使(shi)栅(zha)(zha)(zha)源氧(yang)化层(ceng)击穿,所(suo)以要在MOS管(guan)(guan)栅(zha)(zha)(zha)极(ji)(ji)(ji)(ji)并(bing)联稳(wen)(wen)压(ya)管(guan)(guan)以限制栅(zha)(zha)(zha)极(ji)(ji)(ji)(ji)电(dian)压(ya)在稳(wen)(wen)压(ya)管(guan)(guan)稳(wen)(wen)压(ya)值以下,保护MOS管(guan)(guan)不被击穿,MOS管(guan)(guan)栅(zha)(zha)(zha)极(ji)(ji)(ji)(ji)并(bing)联电(dian)阻是(shi)为了释放栅(zha)(zha)(zha)极(ji)(ji)(ji)(ji)电(dian)荷(he),不让电(dian)荷(he)积累。
3)防护(hu)漏(lou)源极(ji)之间过(guo)电压 虽然漏(lou)源击穿电压VDS一般都很大,但如果漏(lou)源极(ji)不加保护(hu)电路(lu),同样有可能因为器件(jian)开(kai)关瞬(shun)间电流的突(tu)变而(er)产(chan)生(sheng)(sheng)漏(lou)极(ji)尖峰电压,进而(er)损坏MOS管,功率管开(kai)关速度越(yue)快,产(chan)生(sheng)(sheng)的过(guo)电压也就越(yue)高。为了防止器件(jian)损坏,通(tong)常采用齐纳二极(ji)管钳位和RC缓(huan)冲电路(lu)等保护(hu)措施。
当(dang)电(dian)(dian)(dian)(dian)流过大或者发生短(duan)路(lu)时,功率MOS管漏极(ji)与源极(ji)之间(jian)的电(dian)(dian)(dian)(dian)流会迅(xun)速增(zeng)加(jia)并超过额定(ding)值(zhi),必须在过流极(ji)限值(zhi)所规定(ding)的时间(jian)内关断功率MOS管,否则器(qi)件(jian)将被烧坏,因此(ci)在主回路(lu)增(zeng)加(jia)电(dian)(dian)(dian)(dian)流采样保(bao)护电(dian)(dian)(dian)(dian)路(lu),当(dang)电(dian)(dian)(dian)(dian)流到达一定(ding)值(zhi),通(tong)过保(bao)护电(dian)(dian)(dian)(dian)路(lu)关闭驱动电(dian)(dian)(dian)(dian)路(lu)来 保(bao)护MOS管。图1是MOS管的保(bao)护电(dian)(dian)(dian)(dian)路(lu),由此(ci)可(ke)以清楚(chu)的看出(chu)保(bao)护电(dian)(dian)(dian)(dian)路(lu)的功能。
(1):等效(xiao)电路
(2):说明(ming)
功(gong)率 MOSFET 正向导通时(shi)可用(yong)一电阻(zu)等效(xiao),该(gai)电阻(zu)与温度有(you)关(guan)(guan),温度升(sheng)高,该(gai)电阻(zu)变大;它还(hai)与门(men)极(ji)驱动电压(ya)的(de)大小有(you)关(guan)(guan),驱动电压(ya)升(sheng)高,该(gai)电阻(zu)变小。详细(xi)的(de)关(guan)(guan)系曲线可从制(zhi)造商(shang)的(de)手册中获得。
(1):等效电路(门极不加控(kong)制)
(2):说明(ming)
即内(nei)部二极管的等效电路(lu),可(ke)用一(yi)电压降等效,此(ci)二极管为MOSFET 的体二极管,多数情况下,因其特性很差,要避免使用。
(1):等效电路(门极加控制)
(2):说(shuo)明(ming)
功率 MOSFET 在(zai)门级控制下(xia)的(de)反向导通,也可用一电(dian)(dian)(dian)阻等效,该(gai)(gai)电(dian)(dian)(dian)阻与(yu)温度(du)有关,温度(du)升高,该(gai)(gai)电(dian)(dian)(dian)阻变大;它还与(yu)门极驱动电(dian)(dian)(dian)压(ya)的(de)大小(xiao)有关,驱动电(dian)(dian)(dian)压(ya)升高,该(gai)(gai)电(dian)(dian)(dian)阻变小(xiao)。详(xiang)细的(de)关系(xi)曲线(xian)可从制造商的(de)手册中获得。此(ci)工作(zuo)状态称(cheng)为MOSFET 的(de)同步整(zheng)流(liu)工作(zuo),是低压(ya)大电(dian)(dian)(dian)流(liu)输(shu)出开关电(dian)(dian)(dian)源(yuan)中非常重要(yao)的(de)一种(zhong)工作(zuo)状态。
(1):等效电路
(2):说明
功率(lv) MOSFET 正向(xiang)截止时可(ke)用一电容等(deng)效,其(qi)容量与所加的正向(xiang)电压(ya)、环境(jing)温度(du)等(deng)有关,大小(xiao)可(ke)从制造商的手(shou)册(ce)中获得。
功率MOSFET的稳态(tai)特性总结
(1):功(gong)率MOSFET 稳(wen)态时(shi)的电流/电压曲线
(2):说(shuo)明
功率 MOSFET 正向饱和(he)导通时的稳态工作点
当(dang)门极(ji)不(bu)加控(kong)制时,其反向导(dao)通(tong)的(de)稳态工作点同二极(ji)管。
(3):稳态(tai)特性总结
-- 门极与源(yuan)极间的电(dian)(dian)压Vgs 控制器(qi)件(jian)的导(dao)通状态(tai);当(dang)VgsVth时(shi),器(qi)件(jian)处于导(dao)通状态(tai);器(qi)件(jian)的通态(tai)电(dian)(dian)阻与Vgs有关(guan),Vgs大,通态(tai)电(dian)(dian)阻小;多数器(qi)件(jian)的Vgs为 12V-15V ,额定值为+-30V;
-- 器件(jian)的(de)漏极(ji)电流(liu)额(e)定是用它的(de)有效值(zhi)或平均值(zhi)来标(biao)称的(de);只(zhi)要实际的(de)漏极(ji)电流(liu)有效值(zhi)没(mei)有超过其额(e)定值(zhi),保证散热(re)没(mei)问题,则器件(jian)就(jiu)是安全的(de);
-- 器件的通态(tai)电阻呈(cheng)正温度系数,故原理上很容(rong)易并联扩容(rong),但实际并联时,还要考虑(lv)驱动(dong)的对称(cheng)性(xing)和(he)动(dong)态(tai)均流(liu)问题;
-- 目前(qian)的 Logic-Level的功率 MOSFET,其Vgs只要 5V,便可保证漏(lou)源通态(tai)电阻(zu)很小;
-- 器件的同步(bu)整流工作状态已变得(de)愈来(lai)愈广(guang)泛,原因是它的通(tong)态电(dian)阻非常(chang)小(目前最小的为(wei)2-4 毫欧),在低(di)压(ya)大电(dian)流输(shu)出的DC/DC 中已是最关键(jian)的器件;
图2(a)为常用(yong)的(de)小功率驱动电路,简单(dan)可靠(kao)成本低。适用(yong)于不要求(qiu)隔离的(de)小功率开(kai)(kai)关(guan)(guan)设备。图2(b)所(suo)示驱动电路开(kai)(kai)关(guan)(guan)速度很快,驱动能力强,为防止两个MOSFET管直通,通常串(chuan)接一个0.5~1Ω小电阻用(yong)于限(xian)流,该电路适用(yong)于不要求(qiu)隔离的(de)中(zhong)功率开(kai)(kai)关(guan)(guan)设备。这两种电路特点是结构(gou)简单(dan)。
图2 常用(yong)的不隔离的互补驱动(dong)电路
功率mos属于电(dian)(dian)(dian)(dian)压(ya)(ya)型控制器(qi)件,只要(yao)栅极和源极之间施加的电(dian)(dian)(dian)(dian)压(ya)(ya)超过其(qi)阀值电(dian)(dian)(dian)(dian)压(ya)(ya)就会导通(tong)(tong)。由于MOSFET存(cun)在(zai)结电(dian)(dian)(dian)(dian)容,关断(duan)(duan)时其(qi)漏源两(liang)端(duan)电(dian)(dian)(dian)(dian)压(ya)(ya)的突然上升(sheng)将会通(tong)(tong)过结电(dian)(dian)(dian)(dian)容在(zai)栅源两(liang)端(duan)产生干(gan)扰(rao)(rao)电(dian)(dian)(dian)(dian)压(ya)(ya)。常用的互补驱(qu)动电(dian)(dian)(dian)(dian)路的关断(duan)(duan)回(hui)路阻抗小(xiao),关断(duan)(duan)速度较快(kuai),但(dan)它不能提(ti)供(gong)负(fu)压(ya)(ya),故抗干(gan)扰(rao)(rao)性较差。为了提(ti)高电(dian)(dian)(dian)(dian)路的抗干(gan)扰(rao)(rao)性,可在(zai)此种驱(qu)动电(dian)(dian)(dian)(dian)路的基(ji)础(chu)上增加一级有V1、V2、R组(zu)成(cheng)的电(dian)(dian)(dian)(dian)路,产生一个(ge)负(fu)压(ya)(ya),电(dian)(dian)(dian)(dian)路原(yuan)理图(tu)如图(tu)3所示。
图3 提(ti)供负压的(de)互(hu)补电(dian)路
当V1导(dao)通(tong)(tong)(tong)时(shi),V2关(guan)(guan)(guan)断(duan)(duan)(duan),两(liang)个MOSFET中的(de)(de)上(shang)(shang)(shang)管(guan)(guan)(guan)的(de)(de)栅(zha)、源(yuan)(yuan)极放电(dian),下管(guan)(guan)(guan)的(de)(de)栅(zha)、源(yuan)(yuan)极充电(dian),即上(shang)(shang)(shang)管(guan)(guan)(guan)关(guan)(guan)(guan)断(duan)(duan)(duan),下管(guan)(guan)(guan)导(dao)通(tong)(tong)(tong),则被驱(qu)动的(de)(de)功率管(guan)(guan)(guan)关(guan)(guan)(guan)断(duan)(duan)(duan);反之V1关(guan)(guan)(guan)断(duan)(duan)(duan)时(shi),V2导(dao)通(tong)(tong)(tong),上(shang)(shang)(shang)管(guan)(guan)(guan)导(dao)通(tong)(tong)(tong),下管(guan)(guan)(guan)关(guan)(guan)(guan)断(duan)(duan)(duan),使驱(qu)动的(de)(de)管(guan)(guan)(guan)子(zi)导(dao)通(tong)(tong)(tong)。因为上(shang)(shang)(shang)下两(liang)个管(guan)(guan)(guan)子(zi)的(de)(de)栅(zha)、源(yuan)(yuan)极通(tong)(tong)(tong)过不(bu)同的(de)(de)回路充放电(dian),包含有V2的(de)(de)回路,由于V2会(hui)不(bu)断(duan)(duan)(duan)退出饱和(he)直至(zhi)关(guan)(guan)(guan)断(duan)(duan)(duan),所以对于S1而(er)言导(dao)通(tong)(tong)(tong)比(bi)关(guan)(guan)(guan)断(duan)(duan)(duan)要慢,对于S2而(er)言导(dao)通(tong)(tong)(tong)比(bi)关(guan)(guan)(guan)断(duan)(duan)(duan)要快,所以两(liang)管(guan)(guan)(guan)发热程度也不(bu)完(wan)全一样,S1比(bi)S2发热严重。
该驱(qu)动电路(lu)的(de)缺点是需要双电源,且由于R的(de)取值不能(neng)过大,否则会(hui)使V1深度(du)饱和(he),影响关断速度(du),所以R上会(hui)有一定的(de)损耗。
(1)正激式驱动电路。电路原理(li)如图(a)所示,N3为(wei)去(qu)磁绕(rao)组,S2为(wei)所驱动的(de)功率管。R2为(wei)防止功率管栅(zha)极(ji)(ji)、源极(ji)(ji)端电压(ya)振荡的(de)一(yi)个阻(zu)尼电阻(zu)。因不要求(qiu)漏感较小,且从(cong)速度方面(mian)考虑,一(yi)般(ban)R2较小,故(gu)在分析中忽略不计。
图4正激(ji)驱动电路(lu)
其等(deng)效(xiao)(xiao)电(dian)路图如图4(b)所示(shi)脉(mai)冲(chong)不要求的(de)副边并联一电(dian)阻R1,它(ta)做为正激(ji)变换器的(de)假负载(zai),用于消除关断(duan)期间输出电(dian)压发(fa)生振荡而误导通。同时它(ta)还可以作为功率MOSFET关断(duan)时的(de)能(neng)量泄放回(hui)路。该驱动(dong)(dong)电(dian)路的(de)导通速度(du)主(zhu)要与(yu)被驱动(dong)(dong)的(de)S2栅极、源极等(deng)效(xiao)(xiao)输入电(dian)容的(de)大小、S1的(de)驱动(dong)(dong)信号的(de)速度(du)以及(ji)S1所能(neng)提供的(de)电(dian)流大小有关。由(you)仿真及(ji)分析可知(zhi),占空比(bi)D越(yue)小、R1越(yue)大、L越(yue)大,磁化电(dian)流越(yue)小,U1值(zhi)越(yue)小,关断(duan)速度(du)越(yue)慢。
该电路具有以下优点:①电路结构简单(dan)可靠(kao),实现了隔离驱动。 ②只需单(dan)电源即(ji)可提供导通(tong)时(shi)(shi)的(de)(de)正、关断时(shi)(shi)负(fu)压。 ③占空比固定时(shi)(shi),通(tong)过合理的(de)(de)参数设计,此(ci)驱动电路也具有较快的(de)(de)开关速度。
该电(dian)路存(cun)(cun)在的(de)缺点:一是由于隔离(li)变压器副(fu)边需要噎嗝假负载防振荡,故电(dian)路损耗较(jiao)大;二是当(dang)占空比变化时(shi)关断速(su)度(du)变化较(jiao)大。脉宽较(jiao)窄时(shi),由于是储存(cun)(cun)的(de)能量减少(shao)导(dao)致MOSFET栅极(ji)的(de)关断速(su)度(du)变慢。
(2)有(you)隔离(li)变压器的(de)互补(bu)驱动电路。如图5所(suo)示,V1、V2为(wei)互补(bu)工作,电容C起(qi)隔离(li)直流的(de)作用,T1为(wei)高(gao)频、高(gao)磁率的(de)磁环或(huo)磁罐(guan)。
图(tu)5 有隔离变压器(qi)的互补(bu)驱动(dong)电(dian)路
导(dao)通(tong)时(shi)隔离(li)变(bian)压器上(shang)的电(dian)压为(wei)(1-D)Ui、关断时(shi)为(wei)D Ui,若主(zhu)功(gong)率管S可靠导(dao)通(tong)电(dian)压为(wei)12V,而隔离(li)变(bian)压器原副边匝比N1/N2为(wei)12/[(1-D)Ui]。为(wei)保(bao)证导(dao)通(tong)期间GS电(dian)压稳(wen)定C值(zhi)可稍取大(da)些。该(gai)电(dian)路(lu)具(ju)有以下优(you)点:
①电路结(jie)构简单可靠,具(ju)有电气隔离作用。当脉宽(kuan)变化时(shi),驱动的关断能力(li)不会随着变化。
②该电(dian)路只需一(yi)个电(dian)源,即为单电(dian)源工作(zuo)(zuo)。隔直电(dian)容C的(de)作(zuo)(zuo)用可以在关断所(suo)驱(qu)动的(de)管子时(shi)提(ti)供一(yi)个负(fu)压(ya),从而加速(su)了功率管的(de)关断,且有较(jiao)高的(de)抗干扰能力。
但该(gai)电路(lu)(lu)存在的(de)一个较(jiao)大(da)缺(que)点是输出电压的(de)幅值会随着占空(kong)(kong)(kong)比的(de)变(bian)(bian)化而变(bian)(bian)化。当(dang)D较(jiao)小时(shi)(shi),负向电压小,该(gai)电路(lu)(lu)的(de)抗干扰(rao)性变(bian)(bian)差,且正向电压较(jiao)高,应(ying)该(gai)注意(yi)使其幅值不(bu)超(chao)过MOSFET栅极(ji)的(de)允许(xu)电压。当(dang)D大(da)于(yu)(yu)0.5时(shi)(shi)驱(qu)动电压正向电压小于(yu)(yu)其负向电压,此时(shi)(shi)应(ying)该(gai)注意(yi)使其负电压值不(bu)超(chao)过MOAFET栅极(ji)允许(xu)电压。所以该(gai)电路(lu)(lu)比较(jiao)适用(yong)于(yu)(yu)占空(kong)(kong)(kong)比固定(ding)或(huo)占空(kong)(kong)(kong)比变(bian)(bian)化范围(wei)不(bu)大(da)以及占空(kong)(kong)(kong)比小于(yu)(yu)0.5的(de)场(chang)合(he)。
(3)集成芯片UC3724/3725构成的驱(qu)动(dong)电(dian)路
功率(lv)(lv)mos电路构(gou)成(cheng)如图6所示。其中UC3724用来产(chan)(chan)生(sheng)高(gao)(gao)频(pin)载(zai)波信号(hao),载(zai)波频(pin)率(lv)(lv)由(you)电容CT和电阻(zu)RT决(jue)定。一(yi)般载(zai)波频(pin)率(lv)(lv)小于600kHz,4脚和6脚两端产(chan)(chan)生(sheng)高(gao)(gao)频(pin)调(diao)制(zhi)波,经高(gao)(gao)频(pin)小磁环(huan)变压器隔(ge)离后送到UC3725芯片(pian)7、8两脚经UC3725进(jin)行调(diao)制(zhi)后得(de)到驱动信号(hao),UC3725内部有(you)一(yi)肖特基整(zheng)流桥同时将7、8脚的高(gao)(gao)频(pin)调(diao)制(zhi)波整(zheng)流成(cheng)一(yi)直流电压供驱动所需功率(lv)(lv)。
一(yi)般(ban)来说载波频率(lv)越(yue)(yue)高驱动延时越(yue)(yue)小,但太(tai)高抗干扰(rao)变(bian)(bian)(bian)差;隔离(li)变(bian)(bian)(bian)压(ya)器(qi)磁(ci)(ci)化电感(gan)越(yue)(yue)大磁(ci)(ci)化电流越(yue)(yue)小,UC3724发(fa)热越(yue)(yue)少,但太(tai)大使匝数增多导(dao)致寄生(sheng)参数影响(xiang)变(bian)(bian)(bian)大,同样会使抗干扰(rao)能(neng)力降低(di)。根据实(shi)验数据得出:对(dui)于(yu)(yu)(yu)开(kai)关频率(lv)小于(yu)(yu)(yu)100kHz的信号一(yi)般(ban)取(400~500)kHz载波频率(lv)较好,变(bian)(bian)(bian)压(ya)器(qi)选用较高磁(ci)(ci)导(dao)如5K、7K等高频环形磁(ci)(ci)芯,其原边磁(ci)(ci)化电感(gan)小于(yu)(yu)(yu)约(yue)1毫亨左右(you)为好。
这种驱动电(dian)路(lu)仅适合(he)(he)于(yu)信(xin)(xin)号(hao)频(pin)率(lv)小于(yu)100kHz的(de)(de)场(chang)合(he)(he),因信(xin)(xin)号(hao)频(pin)率(lv)相对载波频(pin)率(lv)太高(gao)的(de)(de)话,相对延时(shi)太多,且所需(xu)驱动功率(lv)增(zeng)大,UC3724和UC3725芯片发(fa)热温(wen)升较(jiao)高(gao),故100kHz以上(shang)开关(guan)频(pin)率(lv)仅对较(jiao)小极电(dian)容的(de)(de)MOSFET才(cai)可(ke)以。对于(yu)1kVA左右开关(guan)频(pin)率(lv)小于(yu)100kHz的(de)(de)场(chang)合(he)(he),它是一(yi)种良好的(de)(de)驱动电(dian)路(lu)。该电(dian)路(lu)具有以下特点:单电(dian)源(yuan)工作,控制信(xin)(xin)号(hao)与驱动实现(xian)隔离,结构简单尺寸较(jiao)小,尤其适用于(yu)占空(kong)比变(bian)化不确定或(huo)信(xin)(xin)号(hao)频(pin)率(lv)也变(bian)化的(de)(de)场(chang)合(he)(he)。
图6 集成芯(xin)片(pian)UC3724/3725构成的(de)驱动电路
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