cmos器件的输入输出的特(te)征(zheng)是什么(me)它(ta)的答案(an)全在这里(li)
信息(xi)来源:本站 日期:2017-09-05
构成(cheng)计算机、便携式电(dian)话、光盘唱机、汽车驾驶导向系(xi)统等各种电(dian)子(zi)设备(bei)的(de)主要进行逻辑(ji)处(chu)理(li)的(de)CMOS器(qi)件(CMOS逻辑(ji))的(de)输(shu)(shu)入、输(shu)(shu)出必须要与其(qi)他器(qi)件相连(lian)接。电(dian)子(zi)设备(bei)是人操作(zuo)的(de),其(qi)结果(guo)也必须是人的(de)视觉、听觉能够(gou)感受到的(de)。
电(dian)(dian)子(zi)设备的(de)(de)(de)输(shu)(shu)入部分有人接触操作的(de)(de)(de)机(ji)械部分,遥控信(xin)号(hao)(hao)的(de)(de)(de)接收部分,将光(guang)、温度(du)、压力(li)、磁的(de)(de)(de)变(bian)(bian)化(hua)变(bian)(bian)换为电(dian)(dian)信(xin)号(hao)(hao)传(chuan)达环境变(bian)(bian)化(hua)的(de)(de)(de)传(chuan)感器(qi)部分等。而电(dian)(dian)子(zi)设备的(de)(de)(de)输(shu)(shu)出,将逻(luo)辑处(chu)理的(de)(de)(de)电(dian)(dian)信(xin)号(hao)(hao)通过液(ye)晶或lED显示,或者控制电(dian)(dian)流使马达旋(xuan)转等。另外,在输(shu)(shu)入与输(shu)(shu)出之间(jian)对电(dian)(dian)信(xin)号(hao)(hao)进行处(chu)理的(de)(de)(de)不(bu)仅是(shi)一(yi)个CMOS逻(luo)辑,还有大量的(de)(de)(de)各种半(ban)导(dao)体(ti)器(qi)件。因此(ci),为了实(shi)现CMOS的(de)(de)(de)输(shu)(shu)入输(shu)(shu)出还需要能够与各种信(xin)号(hao)(hao)电(dian)(dian)
平(ping)接(jie)口的技术。
通用(yong)的(de)(de)数字器件(逻(luo)辑IC)的(de)(de)电(dian)(dian)学特性(xing)和(he)(he)接口(kou)规格(ge)是由EIA(Electronic Indus-tries Assoclation,电(dian)(dian)子工业协会)所属的(de)(de)JEDEC(Joint Electron Device Englneer-ing Council,联合(he)电(dian)(dian)子器件工程委员(yuan)会)进行(xing)审议、决(jue)定(ding)(ding)的(de)(de)全球性(xing)的(de)(de)标准。小论CMOS、双极.Bi-CMOS,凡是输入(ru)输出2值逻(luo)辑的(de)(de)通用(yong)器件的(de)(de)电(dian)(dian)学特性(xing)和(he)(he)接口(kou)规格(ge),都由JEDEC审议、决(jue)定(ding)(ding)。
另一方(fang)面(mian),在(zai)2值(zhi)逻辑接口的(de)某些特(te)定的(de)应用中(zhong),为了便于操(cao)作(zuo)也会有附加的(de)特(te)殊功能和规格。例(li)如LVDS、IEEE(例(li)IEEE1394)、USP(例(li)如USB2.0)等规格,这些个别的(de)、特(te)定用途的(de)标准(zhun)化丁作(zuo)也在(zai)不断进行(xing)中(zhong)。
在数字(zi)与模拟的(de)(de)边界上信号(hao)过(guo)渡的(de)(de)场(chang)合(he),或者数字(zi)系统中输出(chu)信号(hao)的(de)(de)器件与接受这个输出(chu)的(de)(de)输入端在信号(hao)电(dian)压振幅产生差(cha)异(yi)的(de)(de)场(chang)合(he),都需(xu)要特(te)别注意接口问题。
在讨论与其他器件连(lian)接传输信号的(de)(de)接口问题(ti)之前,首先需要深入(ru)理解自身(shen)的(de)(de)输入(ru)、输出(chu)特(te)性(xing)。还需认识在信号传输过程(cheng)中(zhong)的(de)(de)延迟时(shi)间、噪声(sheng)特(te)性(xing)等问题(ti)。
图13.3示出(chu)CMOS器件的输(shu)(shu)(shu)入(ru)(ru)等(deng)效电(dian)(dian)(dian)(dian)路(以下写作输(shu)(shu)(shu)入(ru)(ru)电(dian)(dian)(dian)(dian)路)以及输(shu)(shu)(shu)入(ru)(ru)电(dian)(dian)(dian)(dian)流—输(shu)(shu)(shu)入(ru)(ru)电(dian)(dian)(dian)(dian)压特性(xing)。CMOS的输(shu)(shu)(shu)入(ru)(ru)端附加有(you)防静电(dian)(dian)(dian)(dian)和(he)外来(lai)浪涌(yong)进人输(shu)(shu)(shu)入(ru)(ru)栅极的保(bao)护(hu)(hu)电(dian)(dian)(dian)(dian)路。CMOS的输(shu)(shu)(shu)入(ru)(ru)栅极电(dian)(dian)(dian)(dian)阻(zu)是(shi)(shi)几(ji)十MΩ以上的高(gao)(gao)电(dian)(dian)(dian)(dian)阻(zu)(高(gao)(gao)阻(zu)抗),所以实(shi)际的输(shu)(shu)(shu)入(ru)(ru)特性(xing)看到的是(shi)(shi)保(bao)护(hu)(hu)电(dian)(dian)(dian)(dian)路的特性(xing)。CMOS输(shu)(shu)(shu)入(ru)(ru)电(dian)(dian)(dian)(dian)路(保(bao)护(hu)(hu)电(dian)(dian)(dian)(dian)路)可(ke)分为以下四种类型:
(1)串(chuan)联(lian)电阻十上拉二极管(Pu)&下拉二极管(PD)。
(2)PU&PD(扩散(san)电阻型PU&PD,扩散(san)电阻型PD&PU)。
(3)扩(kuo)散电阻型(xing),二极管+PU/PD(扩(kuo)散电阻型(xing)PU+PD,扩(kuo)散电阻型(xing)PD-PU)。
(4)只(zhi)有PD(PD或者扩散电阻型PD)。
不(bu)论哪(na)种类型,输入(ru)电压在GND~VDD之间,从(cong)输入(ru)到VDD或者(zhe)到GND之间都(dou)具有几十MΩ以(yi)上的高(gao)电阻(zu)(高(gao)阻(zu)抗(kang))。
具(ju)有PU的(de)电(dian)(dian)(dian)(dian)(dian)(dian)路中,如(ru)果输(shu)(shu)入电(dian)(dian)(dian)(dian)(dian)(dian)压(ya)(ya)超过VDD-VF(二极(ji)管的(de)正向电(dian)(dian)(dian)(dian)(dian)(dian)压(ya)(ya)降:0.6~0.8V),那么(me)电(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)将从输(shu)(shu)入向VDD流(liu)(liu)动;如(ru)果输(shu)(shu)入电(dian)(dian)(dian)(dian)(dian)(dian)压(ya)(ya)低(di)于GND-VF(-0.6~-0.8V),那么(me)电(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)将从GND向输(shu)(shu)入流(liu)(liu)动。当二极(ji)管输(shu)(shu)入端有保(bao)(bao)护(hu)电(dian)(dian)(dian)(dian)(dian)(dian)阻时,流(liu)(liu)过二极(ji)管的(de)电(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)值(zhi)被电(dian)(dian)(dian)(dian)(dian)(dian)阻限制。在没有PU只(zhi)有PD的(de)保(bao)(bao)护(hu)电(dian)(dian)(dian)(dian)(dian)(dian)路(电(dian)(dian)(dian)(dian)(dian)(dian)压(ya)(ya)变(bian)换功能:高电(dian)(dian)(dian)(dian)(dian)(dian)压(ya)(ya)变(bian)换为(wei)低(di)电(dian)(dian)(dian)(dian)(dian)(dian)压(ya)(ya))中,电(dian)(dian)(dian)(dian)(dian)(dian)流(liu)(liu)与VDD的(de)值(zhi)无(wu)关(guan),达到PD的(de)击(ji)穿(chuan)电(dian)(dian)(dian)(dian)(dian)(dian)压(ya)(ya)时开(kai)始流(liu)(liu)动。”.
没有串联电(dian)阻(zu)或扩散电(dian)阻(zu)的电(dian)流路径中,当电(dian)流开始(shi)流过二极管时,瞬时大电(dian)流会超过最大额(e)定(ding)电(dian)流,导致(zhi)器件被(bei)击穿或劣化,所以要引起注意(yi)。
图13.4示出CMOS器件的输出等效电路。输出电压在GND~VDD之间表现出通常的MOS晶体管的输出特性。这种状态下,具有由输出电流一输出电压计算出的输出阻抗特性(标准逻辑中是几十Ω)。
在CMOS器件的(de)输(shu)出(chu)(chu)级(ji),由于存(cun)在输(shu)出(chu)(chu)晶体管的(de)寄生二极(ji)管,所以如(ru)果加(jia)GND以下或(huo)者VDD以上的(de)输(shu)出(chu)(chu)电(dian)(dian)压,会有超过最大额定(ding)值的(de)正向(xiang)电(dian)(dian)流(liu)流(liu)过寄生二极(ji)管,导致(zhi)器件劣(lie)化甚至(zhi)被击穿(chuan),必须注意这一点。