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mos管,功率mos管烧坏是什么原因-详解大全(quan)

信息来源:本站(zhan) 日期:2017-12-15 

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MOS在控制器电路中(zhong)的(de)工(gong)作状(zhuang)况(kuang)(kuang):注册进程(cheng)(由截止(zhi)到(dao)导通的(de)过渡(du)进程(cheng))、导通状(zhuang)况(kuang)(kuang)、关断(duan)进程(cheng)(由导通到(dao)截止(zhi)的(de)过渡(du)进程(cheng))、截止(zhi)状(zhuang)况(kuang)(kuang)。

MOS首要(yao)损(sun)耗也(ye)对(dui)应这几个(ge)(ge)状(zhuang)况,开(kai)关损(sun)耗(注(zhu)册进程和关断进程),导通(tong)损(sun)耗,截止损(sun)耗(漏(lou)电流引(yin)起(qi)的,这个(ge)(ge)忽(hu)略不(bu)(bu)计(ji)),还有雪崩能量损(sun)耗。只需把这些损(sun)耗控制(zhi)在mos接受标准(zhun)之内,mos即会正常作业(ye),超出接受规(gui)模,即发作损(sun)坏。而开(kai)关损(sun)耗往(wang)往(wang)大于(yu)导通(tong)状(zhuang)况损(sun)耗(不(bu)(bu)同mos这个(ge)(ge)距离可能很大)

Mos损(sun)坏(huai)首(shou)要原(yuan)因:

过流(liu)----------继续大电流(liu)或(huo)瞬间超大电流(liu)引(yin)起(qi)的结温过高而焚毁;

过压(ya)----------源(yuan)漏(lou)过压(ya)击穿(chuan)、源(yuan)栅极(ji)过压(ya)击穿(chuan);

静电----------静电击穿(chuan)。CMOS电路都怕静电;

Mos开关原理(扼要(yao)(yao))。Mos是(shi)电(dian)压驱动型器材,只需栅(zha)极和(he)源(yuan)级间给一个恰当电(dian)压,源(yuan)级和(he)漏级间通(tong)路就构(gou)成。这个电(dian)流(liu)通(tong)路的(de)(de)电(dian)阻(zu)(zu)被成为mos内(nei)阻(zu)(zu),就是(shi)导通(tong)电(dian)阻(zu)(zu)。这个内(nei)阻(zu)(zu)巨细根本决议(yi)了(le)mos芯片(pian)能接受的(de)(de)最大导通(tong)电(dian)流(liu)(当然和(he)其它要(yao)(yao)素有关,最有关的(de)(de)是(shi)热阻(zu)(zu))。内(nei)阻(zu)(zu)越(yue)(yue)小接受电(dian)流(liu)越(yue)(yue)大(由(you)于发热小)

Mos问题远(yuan)没这么简略(lve),费事(shi)在它的(de)栅极(ji)和(he)源级(ji)间,源级(ji)和(he)漏(lou)级(ji)间,栅极(ji)和(he)漏(lou)级(ji)间内部(bu)都有等(deng)效电(dian)(dian)(dian)(dian)(dian)容。所以给(ji)栅极(ji)电(dian)(dian)(dian)(dian)(dian)压(ya)的(de)进程(cheng)就是给(ji)电(dian)(dian)(dian)(dian)(dian)容充(chong)电(dian)(dian)(dian)(dian)(dian)的(de)进程(cheng)(电(dian)(dian)(dian)(dian)(dian)容电(dian)(dian)(dian)(dian)(dian)压(ya)不能骤变),所以mos源级(ji)和(he)漏(lou)级(ji)间由截止到(dao)导通的(de)注册(ce)进程(cheng)受栅极(ji)电(dian)(dian)(dian)(dian)(dian)容的(de)充(chong)电(dian)(dian)(dian)(dian)(dian)进程(cheng)制约。

可是(shi)(shi),这三个(ge)(ge)(ge)等(deng)效电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)是(shi)(shi)构成串并(bing)联组合关系,它们相互影响,并(bing)不是(shi)(shi)独立的,如果独立的就(jiu)很简(jian)略了。其间一(yi)个(ge)(ge)(ge)要害电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)就(jiu)是(shi)(shi)栅(zha)(zha)(zha)极和漏级间的电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)Cgd,这个(ge)(ge)(ge)电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)业(ye)界(jie)称为(wei)米(mi)勒(le)(le)(le)(le)电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)。这个(ge)(ge)(ge)电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)不是(shi)(shi)恒定的,随栅(zha)(zha)(zha)极和漏级间电(dian)(dian)(dian)(dian)(dian)压(ya)改变而(er)敏捷改变。这个(ge)(ge)(ge)米(mi)勒(le)(le)(le)(le)电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)是(shi)(shi)栅(zha)(zha)(zha)极和源(yuan)级电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)充(chong)电(dian)(dian)(dian)(dian)(dian)的拦路虎,由于栅(zha)(zha)(zha)极给(ji)栅(zha)(zha)(zha)-源(yuan)电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)Cgs充(chong)电(dian)(dian)(dian)(dian)(dian)抵达(da)一(yi)个(ge)(ge)(ge)渠(qu)道(dao)后,栅(zha)(zha)(zha)极的充(chong)电(dian)(dian)(dian)(dian)(dian)电(dian)(dian)(dian)(dian)(dian)流必(bi)(bi)须给(ji)米(mi)勒(le)(le)(le)(le)电(dian)(dian)(dian)(dian)(dian)容(rong)(rong)Cgd充(chong)电(dian)(dian)(dian)(dian)(dian),这时栅(zha)(zha)(zha)极和源(yuan)级间电(dian)(dian)(dian)(dian)(dian)压(ya)不再(zai)升高(gao),抵达(da)一(yi)个(ge)(ge)(ge)渠(qu)道(dao),这个(ge)(ge)(ge)是(shi)(shi)米(mi)勒(le)(le)(le)(le)渠(qu)道(dao)(米(mi)勒(le)(le)(le)(le)渠(qu)道(dao)就(jiu)是(shi)(shi)给(ji)Cgd充(chong)电(dian)(dian)(dian)(dian)(dian)的进程),米(mi)勒(le)(le)(le)(le)渠(qu)道(dao)我们首(shou)要想(xiang)到(dao)的费事就(jiu)是(shi)(shi)米(mi)勒(le)(le)(le)(le)振(zhen)荡。(即,栅(zha)(zha)(zha)极先给(ji)Cgs充(chong)电(dian)(dian)(dian)(dian)(dian),抵达(da)必(bi)(bi)定渠(qu)道(dao)后再(zai)给(ji)Cgd充(chong)电(dian)(dian)(dian)(dian)(dian))

由于这(zhei)个时(shi)分(fen)源级和漏级间电(dian)(dian)(dian)压敏(min)捷改变,内部(bu)电(dian)(dian)(dian)容相(xiang)应敏(min)捷充放电(dian)(dian)(dian),这(zhei)些电(dian)(dian)(dian)流脉(mai)冲(chong)会导致mos寄生电(dian)(dian)(dian)感发生很大(da)感抗,这(zhei)儿(er)面就有(you)电(dian)(dian)(dian)容,电(dian)(dian)(dian)感,电(dian)(dian)(dian)阻组成(cheng)震(zhen)(zhen)动电(dian)(dian)(dian)路(lu)(lu)(能构成(cheng)2个回路(lu)(lu)),而且电(dian)(dian)(dian)流脉(mai)冲(chong)越(yue)强(qiang)频率越(yue)高震(zhen)(zhen)动起伏越(yue)大(da)。所(suo)以最要害的问题就是(shi)这(zhei)个米勒渠道怎么过(guo)渡(du)。

过(guo)(guo)快的充(chong)电(dian)会导(dao)(dao)致剧(ju)烈的米(mi)勒(le)震动(dong),但(dan)过(guo)(guo)慢的充(chong)电(dian)虽减小了(le)震动(dong),但(dan)会延(yan)伸开(kai)关(guan)然(ran)后(hou)添加开(kai)关(guan)损耗。Mos注(zhu)册进(jin)程源级(ji)和(he)漏级(ji)间等效电(dian)阻(zu)(zu)相当于从无穷大电(dian)阻(zu)(zu)到阻(zu)(zu)值很小的导(dao)(dao)通内阻(zu)(zu)(导(dao)(dao)通内阻(zu)(zu)一(yi)(yi)般低压mos只(zhi)需几毫欧(ou)(ou)姆)的一(yi)(yi)个转(zhuan)变(bian)进(jin)程。比方一(yi)(yi)个mos最大电(dian)流(liu)100a,电(dian)池电(dian)压96v,在注(zhu)册进(jin)程中,有那么一(yi)(yi)会儿(er)(刚进(jin)入米(mi)勒(le)渠道(dao)时)mos发(fa)(fa)热(re)功(gong)率(lv)是P=V*I(此刻电(dian)流(liu)已达最大,负(fu)载没(mei)有跑起来,一(yi)(yi)切的功(gong)率(lv)都降(jiang)落在MOS管上(shang)),P=96*100=9600w!这时它发(fa)(fa)热(re)功(gong)率(lv)最大,然(ran)后(hou)发(fa)(fa)热(re)功(gong)率(lv)敏捷(jie)下(xia)降(jiang)直到彻(che)底导(dao)(dao)通时功(gong)率(lv)变(bian)成100*100*0.003=30w(这儿(er)假定这个mos导(dao)(dao)通内阻(zu)(zu)3毫欧(ou)(ou)姆)。开(kai)关(guan)进(jin)程中这个发(fa)(fa)热(re)功(gong)率(lv)改变(bian)是惊人(ren)的。

如(ru)果注册(ce)时刻慢,意味着(zhe)发热从9600w到30w过(guo)渡(du)的(de)慢,mos结(jie)温会升高(gao)(gao)的(de)凶猛。所以开关(guan)(guan)越慢,结(jie)温越高(gao)(gao),简略烧mos。为(wei)了不烧mos,只(zhi)能(neng)下(xia)降mos限流或许(xu)下(xia)降电(dian)(dian)池电(dian)(dian)压(ya)(ya)(ya)(ya),比方给它(ta)约束50a或电(dian)(dian)压(ya)(ya)(ya)(ya)下(xia)降一(yi)(yi)半成(cheng)(cheng)48v,这样(yang)开关(guan)(guan)发热损(sun)耗也下(xia)降了一(yi)(yi)半。不烧管子了。这也是高(gao)(gao)压(ya)(ya)(ya)(ya)控简略烧管子原因,高(gao)(gao)压(ya)(ya)(ya)(ya)控制器和(he)低压(ya)(ya)(ya)(ya)的(de)只(zhi)需(xu)开关(guan)(guan)损(sun)耗不一(yi)(yi)样(yang)(开关(guan)(guan)损(sun)耗和(he)电(dian)(dian)池端电(dian)(dian)压(ya)(ya)(ya)(ya)根本成(cheng)(cheng)正比,假定限流一(yi)(yi)样(yang)),导通损(sun)耗彻(che)底受mos内阻决议,和(he)电(dian)(dian)池电(dian)(dian)压(ya)(ya)(ya)(ya)没任何关(guan)(guan)系。

其实整个(ge)mos注册(ce)(ce)进程非(fei)常复(fu)杂。里边(bian)变量太多。总归就是开(kai)关慢不简略(lve)米(mi)勒震(zhen)动,但开(kai)关损(sun)耗大,管(guan)子(zi)发(fa)热大,开(kai)关速度(du)快理论上开(kai)关损(sun)耗低(di)(只需能(neng)(neng)有用按捺米(mi)勒震(zhen)动),可是往往米(mi)勒震(zhen)动很凶猛(如果米(mi)勒震(zhen)动很严重,可能(neng)(neng)在米(mi)勒渠道就烧管(guan)子(zi)了),反而开(kai)关损(sun)耗也大,而且上臂(bei)mos震(zhen)动更有可能(neng)(neng)引起下臂(bei)mos误导通,构成(cheng)上下臂(bei)短路。所(suo)以这个(ge)很考验设(she)计师的驱动电(dian)路布线和主回(hui)路布线技能(neng)(neng)。最(zui)终就是找(zhao)个(ge)平衡点(一般注册(ce)(ce)进程不超越(yue)1us)。注册(ce)(ce)损(sun)耗这个(ge)最(zui)简略(lve),只和导通电(dian)阻成(cheng)正比,想大电(dian)流低(di)损(sun)耗找(zhao)内阻低(di)的。

下(xia)面介绍下(xia)对一般(ban)用户有用点的(de)。

Mos挑(tiao)选的重要参数扼要阐(chan)明。以datasheet举例阐(chan)明。

栅极(ji)电荷。

Qgs, Qgd

Qgs:指的是栅极从0v充(chong)(chong)电(dian)到对(dui)应电(dian)流(liu)(liu)米勒渠(qu)道(dao)(dao)时(shi)总充(chong)(chong)入(ru)电(dian)荷(实践电(dian)流(liu)(liu)不同(tong),这(zhei)个渠(qu)道(dao)(dao)高度不同(tong),电(dian)流(liu)(liu)越(yue)大,渠(qu)道(dao)(dao)越(yue)高,这(zhei)个值越(yue)大)。这(zhei)个阶段是给(ji)Cgs充(chong)(chong)电(dian)(也相(xiang)当于Ciss,输入(ru)电(dian)容)。

Qgd:指(zhi)的是整(zheng)个(ge)米(mi)勒渠道的总(zong)充电(dian)电(dian)荷(he)(在这称为米(mi)勒电(dian)荷(he))。这个(ge)进程给(ji)Cgd(Crss,这个(ge)电(dian)容(rong)随(sui)着gd电(dian)压不同敏捷改变(bian))充电(dian)。

下(xia)面是型(xing)号stp75nf75.

我(wo)们一(yi)般75管Qgs是27nc,Qgd是47nc。结合它的(de)充电曲(qu)线。

进入渠(qu)道(dao)前给Cgs充电(dian)(dian),总电(dian)(dian)荷Qgs 27nc,渠(qu)道(dao)米勒电(dian)(dian)荷Qgd 47nc。

而在开(kai)关过(guo)冲(chong)中,mos首要发(fa)热(re)区间是粗赤色标(biao)示(shi)(shi)的(de)(de)阶段。从Vgs开(kai)端超(chao)越(yue)阈(yu)值电(dian)压(ya),到米勒(le)渠(qu)道完毕(bi)是首要发(fa)热(re)区间。其间米勒(le)渠(qu)道完毕(bi)后(hou)mos根(gen)本(ben)彻底翻开(kai)这(zhei)时损(sun)耗(hao)(hao)是根(gen)本(ben)导通损(sun)耗(hao)(hao)(mos内阻越(yue)低(di)损(sun)耗(hao)(hao)越(yue)低(di))。阈(yu)值电(dian)压(ya)前,mos没有(you)翻开(kai),简(jian)直没损(sun)耗(hao)(hao)(只需漏电(dian)流引起的(de)(de)一点(dian)损(sun)耗(hao)(hao))。其间又(you)以赤色拐(guai)弯当(dang)地损(sun)耗(hao)(hao)最大(Qgs充电(dian)将近完毕(bi),快到米勒(le)渠(qu)道和刚(gang)进入米勒(le)渠(qu)道这(zhei)个进程发(fa)热(re)功率最大(更粗线(xian)表示(shi)(shi))。

所以(yi)必定充电(dian)(dian)电(dian)(dian)流下,赤(chi)色标示(shi)区(qu)间总电(dian)(dian)荷小的管子会很(hen)快度(du)过,这(zhei)样发(fa)热区(qu)间时(shi)刻就(jiu)短(duan),总发(fa)热量就(jiu)低(di)。所以(yi)理论上(shang)挑选Qgs和Qgd小的mos管能快速度(du)过开关(guan)区(qu)。

导(dao)通内(nei)(nei)(nei)阻。Rds(on)。这个(ge)耐压(ya)必定情况下(xia)是(shi)越(yue)低越(yue)好。不(bu)(bu)过不(bu)(bu)同厂家标的内(nei)(nei)(nei)阻是(shi)有(you)不(bu)(bu)同测(ce)(ce)验(yan)(yan)(yan)条件的。测(ce)(ce)验(yan)(yan)(yan)条件不(bu)(bu)同,内(nei)(nei)(nei)阻测(ce)(ce)量值会不(bu)(bu)一样(yang)。同一管子,温度越(yue)高(gao)内(nei)(nei)(nei)阻越(yue)大(da)(这是(shi)硅半(ban)导(dao)体资料在mos制(zhi)作(zuo)工艺的特性,改变不(bu)(bu)了(le),能稍(shao)改进)。所以大(da)电(dian)流(liu)(liu)测(ce)(ce)验(yan)(yan)(yan)内(nei)(nei)(nei)阻会增大(da)(大(da)电(dian)流(liu)(liu)下(xia)结(jie)温会明显升(sheng)高(gao)),小电(dian)流(liu)(liu)或脉冲电(dian)流(liu)(liu)测(ce)(ce)验(yan)(yan)(yan),内(nei)(nei)(nei)阻下(xia)降(由(you)于(yu)结(jie)温没(mei)有(you)大(da)幅升(sheng)高(gao),没(mei)热堆集)。有(you)的管子标称典型(xing)内(nei)(nei)(nei)阻和你自己用小电(dian)流(liu)(liu)测(ce)(ce)验(yan)(yan)(yan)简直一样(yang),而(er)有(you)的管子自己小电(dian)流(liu)(liu)测(ce)(ce)验(yan)(yan)(yan)比标称典型(xing)内(nei)(nei)(nei)阻低许多(由(you)于(yu)它的测(ce)(ce)验(yan)(yan)(yan)标准(zhun)是(shi)大(da)电(dian)流(liu)(liu))。当(dang)然这儿(er)也有(you)厂家标示(shi)不(bu)(bu)严厉问题,不(bu)(bu)要彻底(di)信任(ren)。

所以挑选标准是------------找Qgs和(he)Qgd小的mos管,并一起(qi)契合(he)低内阻(zu)的mos管。

原因剖析:

1、过(guo)流(liu)的(de)可能(neng)性一般,不扫除在(zai)装车的(de)时(shi)分,电(dian)池的(de)电(dian)流(liu)瞬间超(chao)大(da),引起结温(wen)过(guo)高(gao);

2、过压的(de)可能性最小,电(dian)池电(dian)压不会(hui)超(chao)越(yue)100V,会(hui)低于(yu)安全电(dian)压;

 3、静电的可能(neng)(neng)情最大,静电在各(ge)各(ge)环节中都有可能(neng)(neng)浸透


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